Comment author:[deleted]
14 July 2012 10:50:44PM
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2 points
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That seems feasible if you knew both the model and the operating system, and had a scan showing very precise relative temperatures. You could then match the state of the simulated phone to a long but finite list of the possible states of the phone given the operating system. But I'm not a doctor.
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That seems feasible if you knew both the model and the operating system, and had a scan showing very precise relative temperatures. You could then match the state of the simulated phone to a long but finite list of the possible states of the phone given the operating system. But I'm not a doctor.
It's possible to directly read the state of transistors in the phone's memory via scanning capacitance microscopy (http://www.multiprobe.com/technology/technologyassets/S05_1_direct_measurements_of_charge_in_floating_gate.pdf), so you can reconstruct the actual contents of the memory. Probably the greater challenge would be figuring out how to cut the phone into slices without damaging the memory.